One grounded, explainable, audited decision on every batch. SemiconIQ sits in your batch-release flow — catching defects, off-spec product and label errors before a batch is ever shipped.
Built for semiconductor fabs, foundries & OSAT and co-packers, SemiconIQ sits in the batch-release flow. Every batch and every product image passes through one API call and returns a single grounded decision — RELEASE, REVIEW or HOLD — with confidence, full reasons, recall-ready traceability and a signed Certificate of Conformance.
A clipboard check is a commodity. SemiconIQ detects particles, scratches, pattern deviation, edge and film defects from the pixels, consumes your metrology & e-test results (yield, defect density, CD, overlay), and fuses everything into one grounded, explainable wafer/lot decision. The AI is advisory only — the evidence always wins.
Particles, scratches, die-to-die pattern deviation, edge/bevel defects and film uniformity — measured from the pixels, not eyeballed.
CD uniformity (3σ), overlay and Edge Placement Error computed from consumed metrology and checked against the process spec automatically.
Remaining Useful Life and Reliability Index from tool data, plus PUF chip authentication (genuine vs counterfeit). Consumed metrology in, grounded decision out — audit-ready.
Cp/Cpk, I-MR control charts and defect Pareto, with wafer/lot traceability — hold one lot and every wafer at risk is surfaced instantly.
Hash-chained, signed wafer/lot release certificate — the evidence you hand a customer-quality or reliability auditor.
Autopilot & copilot that explain and recommend — advisory only; physics and rules always win.
Wafer/lot traceability graph — every wafer sharing a lot, tool or process step is surfaced, so a recall or root-cause reaches all at-risk wafers, not just one.
One workspace — live batch decisions, defect counts, confidence, and a signed, hash-chained Certificate of Conformance ready for inspection.
Run an agent per channel, each with its own safe autonomy policy. Auto-clear obvious clean cases; route anything risky to a human. Any open-source camera or scanner works — no vendor SDK.
Wafer fabs, foundries and OSAT (assembly & test) — and the process, yield, metrology, reliability and QA engineers inside them who need fast, corroborated, audit-ready wafer, lot and device decisions.
Start with a shadow-mode pilot on your recent batches — see the defects and off-spec batches it would have caught, and the good batches it would have released faster. Zero production risk.
Talk to SalesSemiconIQ is designed to support the quality and reliability standards that govern semiconductor manufacturing and test.
Supports the traceability automotive-semiconductor supply chains require.
Aligns with recognised reliability and test practice.
Consumes fab equipment and metrology data models.
Governed deployment inside your boundary.
Designed to support and align with the frameworks above. Alignment describes how the platform fits your program; it is not a claim of independent certification unless separately stated.
SemiconIQ is designed to deliver value on day one for a small team, and to scale to a governed, multi-site enterprise deployment on the same platform.
Illustrative walkthroughs of how SemiconIQ is used and the value it creates. Your figures are set on your own data during a proof-of-value engagement.
An emerging yield excursion is surfaced early with the supporting evidence, so engineers act before it spreads.
The same grounded standard is applied across test, so dispositions are consistent and defensible.
A recurring signature across lots is traced to one upstream cause.
A scoped engagement shows the results measured on your own operation before any wide rollout — then scale across the organization on the same platform.
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